Optical constants of wurtzite ZnS thin films determined by spectroscopic ellipsometry

Applied Physics Letters

Volumn 79, Issue 22, 2001, Pages 3612-3614

  Ong, H C ^a,c   Chang, R P H ^b  

^a CITY UNIVERSITY OF HONG KONG   (Hong Kong)

^b Northwestern University   (United States)

^c CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035956141     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1419229     Document Type: Article

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