Structural and optical characterizations of Ni (II) tetraphenyl porphyrin thin films

EPJ Applied Physics

Volumn 57, Issue 3, 2012, Pages

  El Nahass, M M ^a   Abd El Khalek, H M ^b   Nawar, A M ^b  

^a Ain Shams University   (Egypt)

^b SUEZ CANAL UNIVERSITY   (Egypt)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION INDEXES; ANNEALED FILMS; ANNEALING TEMPERATURES; BAND THEORY; DISPERSION ENERGIES; DRUDE MODELS; EFFECTIVE MASS; ELECTRIC DIPOLE STRENGTH; FREE CARRIER CONCENTRATION; FUNDAMENTAL GAPS; GRANULAR PARTICLES; INDIRECT TRANSITION; MOLAR EXTINCTION COEFFICIENT; NANO-POROUS; OPTICAL CHARACTERIZATION; OPTICAL DIELECTRIC CONSTANT; OPTICAL PARAMETER; OSCILLATION ENERGY; OSCILLATOR STRENGTHS; POLARIZABILITIES; PORPHINE; QUARTZ SUBSTRATE; SCAN ELECTRON MICROSCOPY; SINGLE-OSCILLATOR MODEL; SPACE GROUPS; SPATIAL CONFIGURATION; SPECTRAL RANGE; SPECTROPHOTOMETRIC MEASUREMENTS; TETRAPHENYL PORPHYRINS; THERMAL EVAPORATION TECHNIQUE; THIRD-ORDER NONLINEAR SUSCEPTIBILITY; UV-VIS SPECTRUM; XRD;

ANNEALING; ELECTRON MICROSCOPY; FILM PREPARATION; MOLECULAR ORBITALS; NICKEL COMPOUNDS; OPTICAL CONSTANTS; PARTICLES (PARTICULATE MATTER); PORPHYRINS; QUARTZ; REFRACTIVE INDEX; THERMAL EVAPORATION; THIN FILMS; X RAY DIFFRACTION;

OPTICAL FILMS;

EID: 84859075860     PISSN: 12860042     EISSN: 12860050     Source Type: Journal    
DOI: 10.1051/epjap/2012110280     Document Type: Article

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