Relyzer: Exploiting application-level fault equivalence to analyze application resiliency to transient faults

International Conference on Architectural Support for Programming Languages and Operating Systems - ASPLOS

Volumn , Issue , 2012, Pages 123-134

  Hari, Siva Kumar Sastry ^a   Adve, Sarita V ^a   Naeimi, Helia ^b   Ramachandran, Pradeep ^b  

^a University of Illinois at Urbana Champaign   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

architecture; hardware reliability evaluation; low cost hardware resiliency; silent data corruption; transient faults

Indexed keywords

BENCHMARK SUITES; DATA CORRUPTION; FAULT EQUIVALENCE; FAULT INJECTION; FAULT SITES; HARDWARE FAULTS; HARDWARE RELIABILITY EVALUATION; LOW-COST HARDWARE RESILIENCY; LOW-COST SOLUTION; ORDERS OF MAGNITUDE; PRUNING TECHNIQUES; RELIABLE OPERATION; TRANSIENT FAULTS;

ARCHITECTURE; FAULT DETECTION;

BENCHMARKING;

EID: 84858759524     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/2150976.2150990     Document Type: Conference Paper

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