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Journal of Materials Science

Volumn 47, Issue 5, 2012, Pages 2396-2404

Microstructural characterisation of metallurgical grade porous silicon nanosponge particles

(3) Chadwick, E G a Beloshapkin, S a Tanner, D A a

a UNIVERSITY OF LIMERICK (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL-ETCHING PROCESS; CRYSTALLOGRAPHIC ORIENTATIONS; DISORDERED PORES; ECONOMICAL PRODUCTION; ETCHING CONDITION; FOCUSED ION BEAM MILLING; INTERNAL PORES; METALLURGICAL-GRADE SILICON; MICROSTRUCTURAL CHARACTERISATION; PORE DEPTH; PORE DIAMETERS; SILICON PARTICLES; STRUCTURAL MORPHOLOGY; SURFACE PORES;

DRUG DELIVERY; ETCHING; HIGH RESOLUTION ELECTRON MICROSCOPY; METALLURGY; PORE STRUCTURE; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY;

POROUS SILICON;

EID: 84857656505 PISSN: 00222461 EISSN: 15734803 Source Type: Journal
DOI: 10.1007/s10853-011-6060-0 Document Type: Article

Times cited : (15)

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