Characterization of porous silicon by solid-state nuclear magnetic resonance

Journal of Physical Chemistry

Volumn 100, Issue 50, 1996, Pages 19653-19658

  Chang, W K ^a   Liao, M Y ^a   Gleason, K K ^a  

^a Massachusetts Institute of Technology Cambridge   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001101039     PISSN: 00223654     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp961921s     Document Type: Article

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