Direct in situ transmission electron microscopy observation of Al push up during early stages of the Al-induced layer exchange

Scripta Materialia

Volumn 66, Issue 8, 2012, Pages 550-553

  Birajdar, B I ^a   Antesberger, T ^b   Butz, B ^a   Stutzmann, M ^b   Spiecker, E ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b WALTER SCHOTTKY INSTITUT   (Germany)

Author keywords

Analytical electron microscopy; Crystallization; Diffusion; Solar cells; Thin films

Indexed keywords

A-SI LAYERS; AMORPHOUS SI; ANALYTICAL ELECTRON MICROSCOPY; ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY; CRYSTALLIZATION GROWTH; EXPERIMENTAL OBSERVATION; IN-SITU; IN-SITU TRANSMISSION; LAYER EXCHANGE;

AMORPHOUS SILICON; CRYSTALLIZATION; DIFFUSION; GRAIN BOUNDARIES; IN SITU PROCESSING; SILICON; SOLAR CELLS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

ALUMINUM;

EID: 84857640217     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2011.12.045     Document Type: Article

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