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Current Applied Physics

Volumn 12, Issue 3, 2012, Pages 890-895

Some physical properties of in doped copper oxide films produced by ultrasonic spray pyrolysis

(5) Kose, S a Ketenci, E a Bilgin, V b Atay, F a Akyuz, I a

a ESKISEHIR OSMANGAZI UNIVERSITY (Turkey)

b ÇANAKKALE ONSEKIZ MART UNIVERSITY (Turkey)

Author keywords

AFM; CuO:In; Spectroscopic ellipsometry; Ultrasonic spray pyrolysis; X ray diffraction

Indexed keywords

AFM; ATOMIC FORCE MICROSCOPE IMAGES; BAND-GAP VALUES; CUO:IN; DOPED COPPER OXIDES; EFFECT OF IN; EXTINCTION COEFFICIENTS; OPTICAL METHODS; REFLECTANCE SPECTRUM; ULTRASONIC SPRAY PYROLYSIS; ULTRASONIC SPRAY PYROLYSIS TECHNIQUE; UNDOPED FILMS;

INDIUM; OXIDE FILMS; REFRACTIVE INDEX; SPECTROSCOPIC ELLIPSOMETRY; SPRAY PYROLYSIS; SURFACE PROPERTIES; ULTRASONIC TESTING; X RAY DIFFRACTION;

SEMICONDUCTOR DOPING;

EID: 84857458275 PISSN: 15671739 EISSN: None Source Type: Journal
DOI: 10.1016/j.cap.2011.12.004 Document Type: Article

Times cited : (15)

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