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Applied Physics A: Materials Science and Processing

Volumn 75, Issue 3, 2002, Pages 391-395

Optical characterization of thin thermal oxide films on copper by ellipsometry

(2) Derin, H a Kantarli, K b

a CELAL BAYAR UNIVERSITY (Turkey)

b EGE UNIVERSITY (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER OXIDES; ELLIPSOMETRY; ENERGY GAP; GROWTH (MATERIALS); LIGHT REFLECTION; OPACITY; OXIDATION; SPECTRUM ANALYSIS; THERMAL EFFECTS;

THERMAL OXIDE FILMS;

THIN FILMS;

EID: 0036722434 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s003390100989 Document Type: Article

Times cited : (81)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.