메뉴 건너뛰기




Volumn 189, Issue 1, 2010, Pages 173-180

Glassy dynamics in nanometer thin layers of polystyrene

Author keywords

[No Author keywords available]

Indexed keywords


EID: 78449235349     PISSN: 19516355     EISSN: 19516401     Source Type: Journal    
DOI: 10.1140/epjst/e2010-01320-2     Document Type: Article
Times cited : (30)

References (38)
  • 20
    • 0004024743 scopus 로고    scopus 로고
    • F. Kremer, A. Schönhals (Eds.), Springer, Berlin, Heidelberg
    • F. Kremer, A. Schönhals (Eds.) Broadband Dielectric Spectroscopy (Springer, Berlin, Heidelberg, 2003).
    • (2003) Broadband Dielectric Spectroscopy
  • 37
    • 78449232865 scopus 로고    scopus 로고
    • Parameters ε'SiOx and ε''SiOx were obtained from dielectric measurements of evaporated silica of 200 nm thickness
    • Parameters ε'SiOx and ε''SiOx were obtained from dielectric measurements of evaporated silica of 200 nm thickness.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.