CO2 sorption of a thin silica layer determined by spectroscopic ellipsometry

AIChE Journal

Volumn 47, Issue 5, 2001, Pages 1212-1218

  Benes, Nieck E ^a   Spijksma, Gerald ^a   Verweij, Henk ^a   Wormeester, Herbert ^a   Poelsema, Bene ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; AMORPHOUS MATERIALS; CARBON DIOXIDE; ELLIPSOMETRY; ISOTHERMS; OPTICAL PROPERTIES; POROSITY; SILICA; SPECTROSCOPIC ANALYSIS;

THIN LAYERS;

SORPTION;

ALUMINUM OXIDE; CARBON DIOXIDE; SILICON DIOXIDE;

COATING; MEMBRANE; MEMBRANE TECHNOLOGY; POROSITY; SILICA GEL; SORPTION;

ACCURACY; ADSORPTION; ARTICLE; ELLIPSOMETRY; HEAT TRANSFER; ISOTHERM; POROSITY; SPECTROSCOPY; SPECTRUM; TEMPERATURE DEPENDENCE;

ARRHENIUS;

EID: 0035333547     PISSN: 00011541     EISSN: None     Source Type: Journal    
DOI: 10.1002/aic.690470527     Document Type: Article

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