Characterization of the electrical properties of individual p-Si microwire/polymer/n-Si microwire assemblies

Journal of Physical Chemistry C

Volumn 115, Issue 50, 2011, Pages 24945-24950

  Yahyaie, Iman ^a   McEleney, Kevin ^a   Walter, Michael G ^b,c   Oliver, Derek R ^a   Thomson, Douglas J ^a   Freund, Michael S ^a   Lewis, Nathan S ^b  

^a UNIVERSITY OF MANITOBA   (Canada)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^c UNIVERSITY OF NORTH CAROLINA AT CHARLOTTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BI-LAYER; DIRECT CONTACT; DIRECT PRODUCTION; ELECTRICAL RESISTANCES; HIGH TEMPERATURE PROCESS; MECHANICAL FORCE; MICROWIRE; N TYPE SILICON; SI MICROWIRES; SINGLE CELLS; SOLAR FUELS; TUNGSTEN PROBES;

ELECTRIC CONTACTORS; OHMIC CONTACTS; SILICON; TUNGSTEN;

ELECTRIC PROPERTIES;

EID: 84857290589     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp2088719     Document Type: Article

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