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Optics Communications

Volumn 285, Issue 8, 2012, Pages 2182-2188

Nonlinear optical properties of erbium doped zinc oxide (EZO) thin films

(5) Kumari, Vinay a,c Kumar, Vinod b,f Malik, B P c Mehra, R M d Mohan, Devendra e

a Department of Electronics and Communication Engineering (India)

b GURUKUL KANGRI UNIVERSITY (India)

c DEENBANDHU CHHOTU RAM UNIVERSITY OF SCIENCE AND TECHNOLOGY (India)

d SHARDA UNIVERSITY (India)

e GJUS and T ^* (India)

f INTER UNIVERSITY ACCELERATOR CENTRE (India)

Author keywords

EZO; Nonlinear refractive index; Nonlinear susceptibility; Optical limiter; z scan

Indexed keywords

EZO; NONLINEAR REFRACTIVE INDEX; NONLINEAR SUSCEPTIBILITY; OPTICAL LIMITERS; Z SCAN;

ERBIUM; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SOL-GEL PROCESS; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION; ZINC OXIDE; ZINC SULFIDE;

SEMICONDUCTOR DOPING;

EID: 84857050622 PISSN: 00304018 EISSN: None Source Type: Journal
DOI: 10.1016/j.optcom.2011.12.094 Document Type: Article

Times cited : (103)

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