Effect of self assembly on the nonlinear optical characteristics of ZnO thin films

Optics Communications

Volumn 281, Issue 10, 2008, Pages 2938-2943

  Irimpan, Litty ^a   Deepthy, A ^b   Krishnan, Bindu ^c   Kukreja, L M ^d   Nampoori, V P N ^a   Radhakrishnan, P ^a  

^a Department of Physics   (India)

^b AMRITA INSTITUTE OF MEDICAL SCIENCES   (India)

^c CENTRE FOR MATERIALS FOR ELECTRONICS TECHNOLOGY C MET   (India)

^d RAJA RAMANNA CENTRE FOR ADVANCED TECHNOLOGY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

NONLINEAR OPTICS; PHOTONS; SELF ASSEMBLY; SOL-GEL PROCESS; ZINC OXIDE;

NONLINEAR INDEX OF REFRACTION; ZNO THIN FILMS;

THIN FILMS;

EID: 41049086123     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2008.01.029     Document Type: Article

References (14)

1. Guo L., Yang S., Yang C., Yu P., Wang J., Ge W., and Wong G.K.L. Appl. Phys. Lett. 76 (2000) 2901
2. Bagnall D.M., Chen Y.F., Zhu Z., and Yao T. Appl. Phys. Lett. 73 (1998) 1038
3. Newmann U., Grunwald R., Griedner U., and Steinmeyer G. Appl. Phys. Lett. 84 (2004) 170
4. Seelig E.W., Tang B., Yamilov A., Cao H., and Chang R.P.H. Mater. Chem. Phys. 9712 (2002) 1
5. Bahae M.S., Said A.A., Wei T.H., Hagan D.J., and Van Stryland E.W. IEEE J. Quantum Electron. 26 (1990) 760
6. Moreno D.L., Rosa-Cruz E.D., Cuevas F.J., Regalado L.E., Salas P., Rodriguez R., and Castano V.M. Opt. Mat. 19 (2002) 275
7. Sapra S., and Sarma D.D. Phys. Rev. B 69 (2004) 125304
8. Brus L.E. J. Chem. Phys. 80 (1984) 4403
9. Zhang X.J., Ji W., and Tang S.H. J. Opt. Soc. Am. B 14 (1997) 1951
10. Lin J.-H., Chen Y.-J., Lin H.-Y., and Hsieh W.-F. J. Appl. Phys. 97 (2005) 033526
11. Band Y.B., Harter D.J., and Bavli R. Chem. Phys. Lett. 126 (1986) 280
12. Sheik-Bahae M., Hutchings D.C., Hagan D.J., and Van Stryland E.W. IEEE J. Quantum Electron. 27 (1991) 1296
13. Zhang W., Wang H., Wong K.S., Tang Z.K., Wong G.K.L., and Ravinder J. Appl. Phys. Lett. 75 (1999) 3321
14. Suchand Sandeep C.S., Philip R., Satheeshkumar R., and Kumar V. Appl. Phys. Lett. 89 (2006) 063102