Determination of two-photon-generated free-carrier lifetime in semiconductors by a single-beam Z-scan technique

Applied Physics B: Lasers and Optics

Volumn 65, Issue 4-5, 1997, Pages 549-554

  Zhang, X ^a   Fang, H ^a   Tang, S ^a   Ji, W ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

LASER PULSES; LIGHT ABSORPTION; PHOTONS; REFRACTIVE INDEX; SEMICONDUCTING ZINC COMPOUNDS; ZINC OXIDE;

FULL WIDTH AT HALF MAXIMUM (FWHM); SINGLE BEAM Z SCAN TECHNIQUE; ZINC SELENIDE; ZINC SULFIDE;

CHARGE CARRIERS;

EID: 0031246821     PISSN: 09462171     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003400050312     Document Type: Article

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