Electrical characteristics of single, double & surround gate vertical MOSFETs with reduced overlap capacitance

European Solid-State Device Research Conference

Volumn , Issue , 2003, Pages 533-536

  Gili, E ^a   Kunz, V D ^a   De Groot, C H ^a   Uchino, T ^a   Donaghy, D ^b   Hall, S ^b   Ashburn, P ^a  

^a UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

^b UNIVERSITY OF LIVERPOOL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL CHARACTERISTIC; OVERLAP CAPACITANCE; SURROUND GATE; VERTICAL MOSFETS;

EID: 84856949131     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDERC.2003.1256931     Document Type: Conference Paper

References (9)

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