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Volumn 5, Issue 2, 2012, Pages 82-87

Studies of graphene-based nanoelectromechanical switches

Author keywords

atomic force microscopy (AFM); electrostatic force; nanoelectromechanical systems (NEMS); scanning tunneling microscope (STM); Suspended graphene; van der Waals force

Indexed keywords


EID: 84856750372     PISSN: 19980124     EISSN: 19980000     Source Type: Journal    
DOI: 10.1007/s12274-011-0187-9     Document Type: Article
Times cited : (65)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.