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Volumn 84, Issue 3, 2012, Pages 1744-1753

Postacquisition mass resolution improvement in time-of-flight secondary ion mass spectrometry

Author keywords

[No Author keywords available]

Indexed keywords

BIOLOGICAL SPECIMENS; HARDWARE MODIFICATIONS; LOW MASS; MASS RESOLUTION; POST-ACQUISITION PROCESSING; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;

EID: 84856703869     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac203229m     Document Type: Article
Times cited : (9)

References (22)
  • 7
    • 0004123702 scopus 로고    scopus 로고
    • Vickerman, J. C. Briggs, D. IM Publications: Chichester, UK and SurfaceSpectra Limited: Manchester, UK
    • Gilmore, I. In ToF-SIMS: Surface Analysis by Mass Spectrometry; Vickerman, J. C.; Briggs, D., Eds.; IM Publications: Chichester, UK and SurfaceSpectra Limited: Manchester, UK, 2001; pp 262-264.
    • (2001) ToF-SIMS: Surface Analysis by Mass Spectrometry , pp. 262-264
    • Gilmore, I.1
  • 12
    • 84856760261 scopus 로고    scopus 로고
    • Patent Abstract (Basic): JP 2011149755A (Japan).
    • Komatsu, M. Patent Abstract (Basic): JP 2011149755A (Japan), 2011.
    • (2011)
    • Komatsu, M.1
  • 14
    • 0004123702 scopus 로고    scopus 로고
    • Vickerman, J. C. Briggs, D. IM Publications: Chichester, UK and SurfaceSpectra Limited: Manchester, UK
    • Schueler, B. W. In ToF-SIMS: Surface Analysis by Mass Spectrometry; Vickerman, J. C.; Briggs, D., Eds.; IM Publications: Chichester, UK and SurfaceSpectra Limited: Manchester, UK, 2001; pp 76-77.
    • (2001) ToF-SIMS: Surface Analysis by Mass Spectrometry , pp. 76-77
    • Schueler, B.W.1
  • 17
    • 0004123702 scopus 로고    scopus 로고
    • Vickerman, J. C. Briggs, D. IM Publications: Chichester, UK and SurfaceSpectra Limited: Manchester, UK
    • Tyler, B. J. In ToF-SIMS: Surface Analysis by Mass Spectrometry; Vickerman, J. C.; Briggs, D., Eds.; IM Publications: Chichester, UK and SurfaceSpectra Limited: Manchester, UK, 2001; pp 475-493.
    • (2001) ToF-SIMS: Surface Analysis by Mass Spectrometry , pp. 475-493
    • Tyler, B.J.1
  • 19
    • 84890674943 scopus 로고    scopus 로고
    • 2nd ed. Vickerman, J. C. Gilmore, I. S. John Wiley & Sons: Chichester, UK
    • Lee, J. L. S.; Gilmore, I. S. In Surface Analysis - The Principal Techniques, 2nd ed.; Vickerman, J. C.; Gilmore, I. S., Eds.; John Wiley & Sons: Chichester, UK, 2009; pp 563-612.
    • (2009) Surface Analysis - The Principal Techniques , pp. 563-612
    • Lee, J.L.S.1    Gilmore, I.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.