Development of a ToF version of the desktop MiniSIMS utilising a continuous primary ion beam

Applied Surface Science

Volumn 252, Issue 19, 2006, Pages 7308-7311

  Eccles, A J ^a   Vohralik, P ^a   Cliff, B ^a   Jones, C ^a   Long, N ^a  

^a Millbrook Instruments Limited   (United Kingdom)

Author keywords

Desktop; Instrumentation; Secondary ion pulsing; SIMS; Time of flight

Indexed keywords

DATA ACQUISITION; IMAGING TECHNIQUES; ION BEAMS; SECONDARY ION MASS SPECTROMETRY; SPUTTERING;

DESKTOP; INSTRUMENTATION; SECONDARY ION PULSING; TIME-OF-FLIGHT;

TECHNOLOGY TRANSFER;

EID: 33747180154     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.02.159     Document Type: Article

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