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Physical Review B - Condensed Matter and Materials Physics

Volumn 85, Issue 3, 2012, Pages

Scanning probe microscopy imaging of metallic nanocontacts

(4) Stoffler D a Fostner, S b Grutter P b Hoffmann Vogel, R a

a KARLSRUHE INSTITUTE OF TECHNOLOGY (Germany)

b MCGILL UNIVERSITY (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84856497339 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.85.033404 Document Type: Article

Times cited : (25)

References (25)

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