Energy levels of few-electron quantum dots imaged and characterized by atomic force microscopy

Proceedings of the National Academy of Sciences of the United States of America

Volumn 107, Issue 21, 2010, Pages 9496-9501

  Cockinsa, Lynda ^a   Miyahara, Yoichi ^a   Bennett, Steven D ^a   Clerk, Aashish A ^a   Studenikin, Sergei ^b   Poole, Philip ^b   Sachrajda, Andrew ^b   Grutter, Peter ^a  

^a MCGILL UNIVERSITY   (Canada)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

Electrostatic force microscopy; Nanoelectronics; Shell structure; Single electron charging

Indexed keywords

QUANTUM DOT;

ARTICLE; ATOMIC FORCE MICROSCOPY; CONTROLLED STUDY; ELECTRICITY; ELECTRON TRANSPORT; ENERGY YIELD; FORCE; MATHEMATICAL COMPUTING; MOLECULAR ELECTRONICS; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; STRENGTH; SURFACE PROPERTY; TEMPERATURE DEPENDENCE;

EID: 77953113208     PISSN: 00278424     EISSN: 10916490     Source Type: Journal    
DOI: 10.1073/pnas.0912716107     Document Type: Article

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