STM-induced surface aggregates on metals and oxidized silicon

Nanoscale

Volumn 3, Issue 8, 2011, Pages 3391-3394

  Stöffler, Dominik ^a   Löhneysen, Hilbert V ^a,b   Hoffmann, Regina ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^b KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

E-BEAM LITHOGRAPHY; OXIDIZED SILICON; SCANNING TUNNELING MICROSCOPY (STM); SURFACE AGGREGATE; TUNNELING VOLTAGES;

AGGLOMERATION; PLATINUM; SCANNING ELECTRON MICROSCOPY; SILICON OXIDES;

SCANNING TUNNELING MICROSCOPY;

EID: 80051598692     PISSN: 20403364     EISSN: 20403372     Source Type: Journal    
DOI: 10.1039/c1nr10430f     Document Type: Article

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