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Volumn 85, Issue 2, 2012, Pages

Models of triplet self-trapped excitons in SiO 2, HfO 2, and HfSiO 4

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EID: 84856488060     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.85.024120     Document Type: Article
Times cited : (27)

References (65)
  • 6
    • 0001697636 scopus 로고
    • JUPSAU 0031-9015 10.1143/JPSJ.43.1286
    • A. Sumi, J. Phys. Soc. Jpn. JUPSAU 0031-9015 10.1143/JPSJ.43.1286 43, 1286 (1977).
    • (1977) J. Phys. Soc. Jpn. , vol.43 , pp. 1286
    • Sumi, A.1
  • 8
    • 0000720073 scopus 로고    scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.61.5392
    • A. L. Shluger and K. Tanimura, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.61.5392 61, 5392 (2000).
    • (2000) Phys. Rev. B , vol.61 , pp. 5392
    • Shluger, A.L.1    Tanimura, K.2
  • 10
    • 16444366876 scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.52.6254
    • V. E. Puchin, A. L. Shluger, and N. Itoh, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.52.6254 52, 6254 (1995).
    • (1995) Phys. Rev. B , vol.52 , pp. 6254
    • Puchin, V.E.1    Shluger, A.L.2    Itoh, N.3
  • 11
    • 0037437935 scopus 로고    scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.67.035108
    • J. L. Gavartin, P. V. Sushko, and A. L. Shluger, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.67.035108 67, 035108 (2003).
    • (2003) Phys. Rev. B , vol.67 , pp. 035108
    • Gavartin, J.L.1    Sushko, P.V.2    Shluger, A.L.3
  • 13
    • 70349472607 scopus 로고    scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.80.085202
    • S. Lany and A. Zunger, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.80. 085202 80, 085202 (2009).
    • (2009) Phys. Rev. B , vol.80 , pp. 085202
    • Lany, S.1    Zunger, A.2
  • 14
    • 28844485135 scopus 로고    scopus 로고
    • Self-trapped excitons in silicon dioxide: Mechanism and properties
    • DOI 10.1103/PhysRevLett.95.156401, 156401
    • S. Ismail-Beigi and S. G. Louie, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.95.156401 95, 156401 (2005). (Pubitemid 41777523)
    • (2005) Physical Review Letters , vol.95 , Issue.15 , pp. 1-4
    • Ismail-Beigi, S.1    Louie, S.G.2
  • 15
    • 34347324009 scopus 로고    scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.75.205114
    • Y. Ma and M. Rohlfing, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.75. 205114 75, 205114 (2007).
    • (2007) Phys. Rev. B , vol.75 , pp. 205114
    • Ma, Y.1    Rohlfing, M.2
  • 16
    • 0000081495 scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.64.2667
    • A. J. Fisher, W. Hayes, and A. M. Stoneham, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.64.2667 64, 2667 (1990).
    • (1990) Phys. Rev. Lett. , vol.64 , pp. 2667
    • Fisher, A.J.1    Hayes, W.2    Stoneham, A.M.3
  • 21
    • 35248860269 scopus 로고    scopus 로고
    • Theoretical prediction of intrinsic self-trapping of electrons and holes in monoclinic HfO2
    • DOI 10.1103/PhysRevLett.99.155504
    • D. Muñoz Ramo, A. L. Shluger, J. L. Gavartin, and G. Bersuker, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.99.155504 99, 155504 (2007). (Pubitemid 47569113)
    • (2007) Physical Review Letters , vol.99 , Issue.15 , pp. 155504
    • Munoz Ramo, D.1    Shluger, A.L.2    Gavartin, J.L.3    Bersuker, G.4
  • 22
    • 0037096520 scopus 로고    scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.65.233106
    • X. Zhao and D. Vanderbilt, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.65.233106 65, 233106 (2002).
    • (2002) Phys. Rev. B , vol.65 , pp. 233106
    • Zhao, X.1    Vanderbilt, D.2
  • 24
    • 0000035906 scopus 로고    scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.55.10278
    • S. Albrecht, G. Onida, and L. Reining, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.55.10278 55, 10278 (1997).
    • (1997) Phys. Rev. B , vol.55 , pp. 10278
    • Albrecht, S.1    Onida, G.2    Reining, L.3
  • 25
    • 33847360884 scopus 로고    scopus 로고
    • Structure and spectroscopic properties of trapped holes in silica
    • DOI 10.1016/j.jnoncrysol.2006.10.031, PII S0022309306013925
    • A. V. Kimmel, P. V. Sushko, and A. L. Shluger, J. Non-Cryst. Solids JNCSBJ 0022-3093 10.1016/j.jnoncrysol.2006.10.031 353, 599 (2007). (Pubitemid 46341337)
    • (2007) Journal of Non-Crystalline Solids , vol.353 , Issue.5-7 , pp. 599-604
    • Kimmel, A.V.1    Sushko, P.V.2    Shluger, A.L.3
  • 29
    • 0000189651 scopus 로고
    • JCPSA6 0021-9606 10.1063/1.464913
    • A. D. Becke, J. Chem. Phys. JCPSA6 0021-9606 10.1063/1.464913 98, 5648 (1993).
    • (1993) J. Chem. Phys. , vol.98 , pp. 5648
    • Becke, A.D.1
  • 30
    • 0345491105 scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.37.785
    • C. Lee, W. Yang, and R. G. Parr, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.37.785 37, 785 (1988).
    • (1988) Phys. Rev. B , vol.37 , pp. 785
    • Lee, C.1    Yang, W.2    Parr, R.G.3
  • 32
    • 59249105269 scopus 로고    scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.79.035306
    • D. Muñoz Ramo, A. L. Shluger, and G. Bersuker, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.79.035306 79, 035306 (2009).
    • (2009) Phys. Rev. B , vol.79 , pp. 035306
    • Muñoz Ramo, D.1    Shluger, A.L.2    Bersuker, G.3
  • 35
    • 34748816382 scopus 로고    scopus 로고
    • Electron trapping at point defects on hydroxylated silica surfaces
    • DOI 10.1103/PhysRevLett.99.136801
    • L. Giordano, P. V. Sushko, G. Pacchioni, and A. L. Shluger, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.99.136801 99, 136801 (2007). (Pubitemid 47480013)
    • (2007) Physical Review Letters , vol.99 , Issue.13 , pp. 136801
    • Giordano, L.1    Sushko, P.V.2    Pacchioni, G.3    Shluger, A.L.4
  • 39
    • 35949010942 scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.42.9664
    • A. L. Shluger and E. V. Stefanovich, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.42.9664 42, 9664 (1990).
    • (1990) Phys. Rev. B , vol.42 , pp. 9664
    • Shluger, A.L.1    Stefanovich, E.V.2
  • 40
    • 0000013922 scopus 로고    scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.64.245111
    • J. L. Gavartin and A. L. Shluger, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.64.245111 64, 245111 (2001).
    • (2001) Phys. Rev. B , vol.64 , pp. 245111
    • Gavartin, J.L.1    Shluger, A.L.2
  • 42
    • 35648952714 scopus 로고    scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.76.165127
    • I. V. Abarenkov, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.76.165127 76, 165127 (2007).
    • (2007) Phys. Rev. B , vol.76 , pp. 165127
    • Abarenkov, I.V.1
  • 44
    • 33745770836 scopus 로고
    • JCPSA6 0021-9606 10.1063/1.448799
    • P. J. Hay and W. R. Wadt, J. Chem. Phys. JCPSA6 0021-9606 10.1063/1.448799 82, 270 (1985).
    • (1985) J. Chem. Phys. , vol.82 , pp. 270
    • Hay, P.J.1    Wadt, W.R.2
  • 47
    • 33847760293 scopus 로고    scopus 로고
    • Defect states in the high-dielectric-constant gate oxide HfSi O4
    • DOI 10.1063/1.2409662
    • K. Xiong, Y. Du, K. Tse, and J. Robertson, J. App. Phys. JAPIAU 0021-8979 10.1063/1.2409662 101, 024101 (2007). (Pubitemid 46372823)
    • (2007) Journal of Applied Physics , vol.101 , Issue.2 , pp. 024101
    • Xiong, K.1    Du, Y.2    Tse, K.3    Robertson, J.4
  • 48
    • 27644547745 scopus 로고    scopus 로고
    • Sub-bandgap defect states in polycrystalline hafnium oxide and their suppression by admixture of silicon
    • DOI 10.1063/1.2126136, 192903
    • N. V. Nguyen, A. V. Davydov, D. Chandler-Horowitz, and M. M. Frank, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2126136 87, 192903 (2005). (Pubitemid 41567662)
    • (2005) Applied Physics Letters , vol.87 , Issue.19 , pp. 1-3
    • Nguyen, N.V.1    Davydov, A.V.2    Chandler-Horowitz, D.3    Frank, M.M.4
  • 49
    • 20844439462 scopus 로고    scopus 로고
    • (IOP Publishing, Bristol and Philadelphia
    • High-k Dielectrics, edited by M. Houssa (IOP Publishing, Bristol and Philadelphia, 2004) p. 597.
    • (2004) High-k Dielectrics , pp. 597
    • Houssa, M.1
  • 52
    • 0003641685 scopus 로고    scopus 로고
    • in edited by G. Pacchioni, L. Skuja, and D. L. Griscom, Science and Technology NATO Science Series, Series II: Mathematical and Physical Chemistry (Kluwer, Dordrecht
    • 2 and Related Dielectrics, edited by, G. Pacchioni, L. Skuja, and, D. L. Griscom, Science and Technology NATO Science Series, Series II: Mathematical and Physical Chemistry (Kluwer, Dordrecht, 2000).
    • (2000) 2 and Related Dielectrics
    • Wright, A.C.1
  • 59
    • 0038003059 scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.34.2933
    • K. Tanimura and L. E. Halliburton, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.34.2933 34, 2933 (1986).
    • (1986) Phys. Rev. B , vol.34 , pp. 2933
    • Tanimura, K.1    Halliburton, L.E.2
  • 60
    • 0005713334 scopus 로고
    • JPSOAW 0022-3719 10.1088/0022-3719/21/13/004
    • A. L. Shluger, J. Phys. C: Solid State Phys. JPSOAW 0022-3719 10.1088/0022-3719/21/13/004 21, L431 (1988).
    • (1988) J. Phys. C: Solid State Phys. , vol.21 , pp. 431
    • Shluger, A.L.1
  • 61
    • 33746836509 scopus 로고    scopus 로고
    • Characterization of exciton self-trapping in amorphous silica
    • DOI 10.1016/j.jnoncrysol.2006.01.095, PII S0022309306005072
    • R. M. Van Ginhoven, H. Jónsson, and L. R. Corrales, J. Non-Cryst. Sol. JNCSBJ 0022-3093 10.1016/j.jnoncrysol.2006.01.095 352, 2589 (2006). (Pubitemid 44172967)
    • (2006) Journal of Non-Crystalline Solids , vol.352 , Issue.23-25 , pp. 2589-2595
    • Van Ginhoven, R.M.1    Jonsson, H.2    Corrales, L.R.3
  • 62
    • 84856433869 scopus 로고    scopus 로고
    • See Supplemental Material at http://link.aps.org/supplemental/10.1103/ PhysRevB.85.024120 for movies of the lattice relaxation of STE1 and STE2 in periodic and cluster models.


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