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Volumn 352, Issue 23-25, 2006, Pages 2589-2595

Characterization of exciton self-trapping in amorphous silica

Author keywords

61.72.Bb; 61.72.Ji; Defects; Density functional theory; Silica

Indexed keywords

AMORPHOUS MATERIALS; CRYSTAL DEFECTS; ELECTRIC EXCITATION; ELECTRON MOBILITY; EXCITONS; HOLE MOBILITY; LUMINESCENCE;

EID: 33746836509     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2006.01.095     Document Type: Article
Times cited : (28)

References (35)
  • 13
    • 0003105404 scopus 로고    scopus 로고
    • Pacchioni G., Skuja L., and Griscom D.L. (Eds), Kluwer Academic, Dordrecht, Netherlands and references therein
    • 2 and Related Dielectrics: Science and Technology (2000), Kluwer Academic, Dordrecht, Netherlands 73 and references therein
    • (2000) 2 and Related Dielectrics: Science and Technology , pp. 73
    • Skuja, L.1
  • 19
    • 16844362416 scopus 로고    scopus 로고
    • The glass samples G1 and G2 used in this work are the structures labeled Glass 4 and 9, respectively
    • Van Ginhoven R.M., Jónsson H., and Corrales L.R. Phys. Rev. B (2005) 024208 The glass samples G1 and G2 used in this work are the structures labeled Glass 4 and 9, respectively
    • (2005) Phys. Rev. B , pp. 024208
    • Van Ginhoven, R.M.1    Jónsson, H.2    Corrales, L.R.3
  • 34
    • 33746844801 scopus 로고    scopus 로고
    • Private communication with H. Jonsson.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.