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Volumn 59, Issue 2, 2012, Pages 516-519

Characterization and modeling of graphene transistor low-frequency noise

Author keywords

Compact model; graphene; low frequency noise; simulation program with integrated circuit emphasis (SPICE); transistor

Indexed keywords

CHANNEL AREA; COMPACT MODEL; CURRENT NOISE; DC CHARACTERIZATION; FLICKER NOISE; GRAPHENE LAYERS; GRAPHENE TRANSISTORS; JOHNSON NOISE; LOW-FREQUENCY NOISE; LOW-FREQUENCY NOISE MEASUREMENTS; NOISE LEVELS; NOISE MEASUREMENTS; NOISE SOURCE; QUADRATIC DEPENDENCE; SIC SUBSTRATES; SIMULATION PROGRAM WITH INTEGRATED CIRCUIT EMPHASIS;

EID: 84856257479     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2011.2175930     Document Type: Article
Times cited : (14)

References (16)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.