A two-dimensional waveguide beam for X-ray nanodiffraction

Journal of Applied Crystallography

Volumn 45, Issue 1, 2012, Pages 85-92

  Krywka, Christina ^a   Neubauer, Henrike ^b   Priebe, Marius ^b   Salditt, Tim ^b   Keckes, Jozef ^c   Buffet, Adeline ^d   Roth, Stephan Volkher ^d   Doehrmann, Ralph ^d   Mueller, Martin ^e  

^a UNIVERSITY OF KIEL   (Germany)

^b UNIVERSITY OF GÖTTINGEN   (Germany)

^c UNIVERSITY OF LEOBEN   (Austria)

^d DESY   (Germany)

^e INSTITUTE OF MATERIALS RESEARCH   (Germany)

Author keywords

nanodiffraction; waveguides

Indexed keywords

BEAM GEOMETRY; BEAM LINES; CROSS SECTION; EXPERIMENTAL EQUIPMENTS; HARD X RAY; HIGH RESOLUTION; LOCAL GRADIENTS; NANO-FOCUS; NANOCRYSTALLINES; NANODIFFRACTION; PETRA III; SILICON WAVEGUIDE; TIN COATING; TRANSMISSION EFFICIENCY; X-RAY NANODIFFRACTION;

EXPERIMENTS; HARD COATINGS; NANOWIRES; TITANIUM NITRIDE; WAVEGUIDES; X RAYS;

TWO DIMENSIONAL;

EID: 84855973761     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889811049132     Document Type: Article

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