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Journal of Applied Physics

Volumn 111, Issue 1, 2012, Pages

Raman and x-ray photoelectron spectroscopy study of ferroelectric switching in Pb(Nb,Zr,Ti)O 3 thin films

(5) Ramos Moore, E a Ferrari, P a Diaz Droguett, D E a Lederman, D b Evans, J T c

a PONTIFICIA UNIVERSIDAD CATÓLICA DE CHILE (Chile)

b WEST VIRGINIA UNIVERSITY (United States)

c Radiant Technologies Incorporated (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXTERNAL ELECTRIC FIELD; FERROELECTRIC BEHAVIOR; FERROELECTRIC CAPACITORS; FERROELECTRIC PHASE; FERROELECTRIC SWITCHING; IN-SITU TREATMENT; MACROSCOPIC POLARIZATION; VIBRATIONAL MODES; X-RAY PHOTOELECTRON SPECTROSCOPY STUDIES;

BINDING ENERGY; CAPACITORS; ELECTRIC FIELDS; FERROELECTRIC FILMS; FERROELECTRICITY; LEAD; OXYGEN VACANCIES; PHOTONS; SWITCHING; THIN FILMS; ZIRCONIUM;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84855970086 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3675479 Document Type: Article

Times cited : (58)

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