The interface screening model as origin of imprint in PbZr xTi 1-xO 3 thin films. II. Numerical simulation and verification

Journal of Applied Physics

Volumn 92, Issue 5, 2002, Pages 2688-2696

  Grossmann, M ^a   Lohse, O ^a   Bolten, D ^a   Boettger, U ^a   Waser, R ^a,b  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE SEPARATION MECHANISM; CHARGE SEPARATIONS; ELECTRONIC CHARGES; FERROELECTRIC PROPERTY; SCREENING MECHANISM; SCREENING MODELS; SHALLOW TRAPS; SURFACE LAYERS;

ELECTRIC FIELDS; FERROELECTRIC THIN FILMS; SEPARATION;

COMPUTER SIMULATION;

EID: 0036732094     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1498967     Document Type: Article

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