Microstructural characterization of donor-doped lead zirconate titanate films prepared by sol-gel processing

Thin Solid Films

Volumn 402, Issue 1-2, 2002, Pages 65-70

  Zou, Q ^a   Ruda, H ^a   Yacobi, B G ^a   Farrell, M ^b  

^a UNIVERSITY OF TORONTO   (Canada)

^b Energenius Inc   (Canada)

Author keywords

Atomic force; Dielectric properties; Ferroelectric properties; Scanning electron; X Ray diffraction; X Ray photoelectron

Indexed keywords

ATOMIC FORCE MICROSCOPY; DOPING (ADDITIVES); GRAIN SIZE AND SHAPE; LEAD COMPOUNDS; MICROSTRUCTURE; PEROVSKITE; SCANNING ELECTRON MICROSCOPY; SOL-GELS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

PHASE STRUCTURES;

THIN FILMS;

EID: 0036147759     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(01)01708-4     Document Type: Article

References (20)