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Volumn 81, Issue 17, 2002, Pages 3224-3226

Dependence of ferroelectric performance of sol-gel-derived Pb(Zr,Ti)O 3 thin films on bottom-Pt-electrode thickness

(11) Lim, Ji Eun a Park, Dong Yeon a Jeong, Jae Kyeong a Darlinski, Gregor a Kim, Hyeong Joon a Hwang, Cheol Seong a Kim, Seung Hyun b Koo, Chang Young b Woo, Hyun Jung b Lee, Dong Su b Ha, Jowoong b

a Seoul National University (South Korea)

b INOSTEK Inc (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BULK-LIKE; CONDUCTING PHASE; CRYSTALLINE QUALITY; DEPOLARIZING FIELDS; ELECTRODE STACKS; FERROELECTRIC BEHAVIOR; HIGH RESOLUTION X RAY DIFFRACTION; OUTWARD DIFFUSION; PB(ZR , TI)O; PT FILMS; PZT; PZT FILM;

CONDUCTIVE FILMS; FERROELECTRICITY; GELS; IRIDIUM; LATTICE CONSTANTS; LEAD; PLATINUM; SOL-GEL PROCESS; SOL-GELS; SOLS; THIN FILMS; X RAY DIFFRACTION; ZIRCONIUM;

FERROELECTRIC FILMS;

EID: 79955990907 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1516830 Document Type: Article

Times cited : (17)

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