Optimization of EBSD parameters for ultra-fast characterization

Journal of Microscopy

Volumn 245, Issue 2, 2012, Pages 111-118

  Chen, Y ^a   Hjelen, J ^a   Gireesh, S S ^a   Roven, H J ^a  

^a NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

Author keywords

Contamination; Effective spatial resolution; Electron backscatter diffraction (EBSD); Probe current; Step size; Ultrafine grained materials

Indexed keywords

BACKSCATTERING; DATA ACQUISITION; ELECTRON DIFFRACTION; IMAGE RESOLUTION; PROBES;

EFFECTIVE SPATIAL RESOLUTION; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; PROBE CURRENTS; SPATIAL RESOLUTION; STEP SIZE; ULTRA-FAST; ULTRAFINE GRAINED MATERIALS; WORKING DISTANCES;

ELECTRONS;

ARTICLE; CONTAMINATION; ELECTRON BACKSCATTER DIFFRACTION; FAST ELECTRON RADIATION; PRIORITY JOURNAL; SCINTISCANNING; STRUCTURE ANALYSIS; VACUUM;

EID: 84855758203     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2011.03551.x     Document Type: Article

References (25)

1. Bjering, O.K. (2010) In situ EBSD investigation on steel. Master's Thesis, NTNU, Trondheim, Norway.
2. Chen, J., Sekiguchi, T., Xie, R., Ahmet, P., Chikyo, T., Yang, D., Ito, S. & Yin, F. (2005) Electron-beam-induced current study of small-angle grain boundaries in multicrystalline silicon. Scr. Mater. 52, 1211-1215.
3. Chen, Y.J., Li, Y.J., Walmsley, J.C., Dumoulin, S., Skaret, P.C. & Roven, H.J. (2010) Microstructure evolution of commercial pure titanium during equal channel angular pressing. Mater. Sci. Eng. A. 527, 789-796.
4. Chen, Y.J., Li, Y.J., Walmsley, J.C., Dumoulin, S., Armada, S., Subbarayana, S., Skaret, P.C. & Roven, H.J. (2011) Quantitative analysis of grain subdivision in titanium during equal channel angular pressing. Scr. Mater. 64, 904-907.
5. Cocle, J., Gauvin, R., Pierre, H., Lagace, M. & Fuerst, C.D. (2007) Evaluation of the SEM-EBSD system stability and hydrocarbon contamination effect on EBSD band contrast response. Microsc. Microanal. 13(Suppl. 2), 946-947.
6. EDAX/TSL (2007) OIM Analysis 5.3 Software User Manual EDAX/TSL, UT, U.S.A.
7. Geiss, R., Read, D., Roshko, A., Bertness, K. & Keller, R. (2005) Applications of EBSD to the study of localized deformation. Microsc. Microanal. 11, 516-517.
8. Hjelen, J. & Nes, E. (1990) Spatial resolution measurements of electron backscatter diffraction patterns (EBSPs) in the scanning electron microscope. In Proceedings of the XIIth International Congress for Electron Microscopy. San Francisco, CA, U.S.A. (ed. by L.D. Peachey & D.B. Williams ), pp. 404-405.
9. Humphreys, F.J. (2001) Review grain and subgrain characterisation by electron backscatter diffraction. J. Mater. Sci. 36, 3833-3854.
10. Karlsen, M. (2009) EBSD based in-situ observations of polycrystalline materials in the SEM. PhD Thesis, Department of Materials Sciences and Technology, NTNU, Trondheim, Norway
11. Koblischka-Veneva, A., Müklich, F. & Koblischka, M.R. (2002) A study of grain orientation of Alkali doped polycrystalline YBCO ceramics using an EBSD technique. Cryst. Eng. 5, 411-418.
12. Krieger Lassen, N.C., Conradsen, K. & Juul Jensen, D. (1992) Image processing procedures for analysis of electron diffraction patterns. Scanning Microsc. 6, 115-121.
13. Magdalena, L.P. (2003) The effectiveness of automated electron backscatter diffraction in the analysis of rock-forming minerals and metals. Master Thesis, University of Liverpool, Liverpool.
14. Maitland, T. (2004) EBSD - current achievements in speed and resolution. Microsc. Microanal. 10, 936-937.
15. Nowell, M.M., Farrer, J.K. & Witt, R.A. (2003) The effects of EBSD collection speed on indexing accuracy. Microsc. Microanal. 9, 722-723.
16. Pantleon, W. (2008) Resolving the geometrically necessary dislocation content by conventional electron backscattering diffraction. Scr. Mater. 58, 994-997.
17. Saxl, I., Kalousov, A., Ilucov, L. & Sklenicka, V. (2009) Grain and subgrain boundaries in ultrafine-grained materials. Mater. Charact. 60, 1163-1167.
18. Schwartz, A.J., Kumar, M. & Adams, B.L. (2000) Electron Backscatter Diffraction in Materials Science. Kluwer Academic/Plenum Publishers, New York
19. Schwarzer, R.A. & Hjelen, J. (2010) High-speed orientation microscopy with offline solving sequences of EBSD patterns. Solid State Phenom. 160, 295-300.
20. Søfferud, M., Hjelen, J., Karlsen, M., Dingley, D. & Jaksch, H. (2008a) Future prospects on EBSD speeds using a 40 nA FESEM: EMC 2008 In 14th European Microscopy Congress 1-5 September 2008, Aachen, Germany (ed. by M. Luysberg, K. Tillmann & T. Weirich ). Springer, Berlin, pp. 625-626.
21. Søfferud, M., Hjelen, J., Karlsen, M., Breivik, T., Krieger Lassen, N.C. & Schwarzer, R. (2008b) Development of an ultra-fast EBSD detector system: EMC 2008 In 14th European Microscopy Congress 1-5 September 2008, Aachen, Germany (ed. by M. Luysberg, K. Tillmann & T. Weirich ). Springer, Berlin, pp. 623-624.
22. Valiev, R.Z., Islamgaliev, R.K. & Alexandrov, I.V. (2000) Bulk nanostructured materials from severe plastic deformation. Prog. Mater. Sci. 45, 103-189.
23. Venables, J.A. & Harland, C.J. (1973) Electron back scattering patterns - new technique for obtaining crystallographic information in the scanning electron microscope. Phil.Mag. 27, 1193-1200.
24. Wright, S. & Nowell, M. (2008) High-speed EBSD. Adv. Mater. Process. 166, 29-31.
25. Wright, S.I., Nowell, M.M. & Field, D.P. (2011) A review of strain analysis using electron backscatter diffraction. Microsc Microanal. 17, 316-329.