High-speed orientation microscopy with offline solving sequences of EBSD patterns

Solid State Phenomena

Volumn 160, Issue , 2010, Pages 295-300

  Schwarzer, R A ^a   Hjelen, J ^b  

^a Dept of Materials Science and Engineering NTNU ^*  (Germany)

^b NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

Author keywords

3D orientation microscopy; Backscatter kikuchi diffraction; Calibration; EBSD; Hough transform; Phase discrimination; Radon transform

Indexed keywords

ANISOTROPY; BACKSCATTERING; CALIBRATION; CUSTOMER SATISFACTION; ELECTRON DIFFRACTION; HOUGH TRANSFORMS; POLYCRYSTALS; RADON; SCANNING ELECTRON MICROSCOPY; TEXTURES; THREE DIMENSIONAL; TOTAL QUALITY MANAGEMENT; DIFFRACTION;

3D ORIENTATION MICROSCOPY; BACKSCATTER KIKUCHI DIFFRACTION; BACKSCATTER KIKUCHI DIFFRACTIONS; PHASE DISCRIMINATION; RADON TRANSFORM; EBSD;

SPEED;

EID: 77951020535     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/SSP.160.295     Document Type: Conference Paper

References (9)

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