Microstructure evolution of commercial pure titanium during equal channel angular pressing

Materials Science and Engineering: A

Volumn 527, Issue 3, 2010, Pages 789-796

  Chen, Y J ^a   Li, Y J ^b   Walmsley, J C ^b   Dumoulin, S ^b   Skaret, P C ^a   Roven, H J ^a  

^a NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

^b SINTEF MATERIALS AND CHEMISTRY   (Norway)

Author keywords

Commercially pure (CP) Ti; Continuous dynamic recrystallization (CDRX); Electron backscatter diffraction (EBSD); Equal channel angular pressing (ECAP); Grain boundary

Indexed keywords

CRYSTAL MICROSTRUCTURE; DYNAMIC RECRYSTALLIZATION; ELECTRON DIFFRACTION; EQUAL CHANNEL ANGULAR PRESSING; GRAIN SIZE AND SHAPE; TITANIUM;

COMMERCIALLY PURE TI; CONTINUOUS DYNAMIC RECRYSTALLIZATION; CONTINUOUS DYNAMIC RECRYSTALLIZATION (CDRX); ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; EQUAL CHANNEL ANGULAR PRESSING; FLOW LINES; GRAIN-BOUNDARIES; MICROSTRUCTURE EVOLUTIONS;

GRAIN BOUNDARIES;

EID: 71849105572     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2009.09.005     Document Type: Article

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