High-speed EBSD

Advanced Materials and Processes

Volumn 166, Issue 2, 2008, Pages 29-31

  Wright, Stuart ^a   Nowell, Matt ^a  

^a EDAX TSL   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CCD CAMERAS; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; GRAIN SIZE AND SHAPE; POLYCRYSTALLINE MATERIALS; TEXTURES;

CRYSTALLOGRAPHIC ORIENTATION; ELECTRON BACKSCATTER DIFFRACTION (EBSD); POLYCRYSTALLINE MICROSTRUCTURE; TEXTURE ANALYSIS;

CRYSTALS;

EID: 42249086414     PISSN: 08827958     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (0)