On the temperature dependent dielectric properties, conductivity and resistivity of MIS structures at 1 MHz

Microelectronic Engineering

Volumn 91, Issue , 2012, Pages 154-158

  Eroglu A ^a   Tataroglu A ^a   Altindal, S ^a  

^a GAZI UNIVERSITY   (Turkey)

Author keywords

Ac conductivity; Ac resistivity; Dielectric properties; Electric modulus; MIS structure

Indexed keywords

AC CONDUCTIVITY; CONDUCTION MECHANISM; DIELECTRIC DATA; DIFFERENT SLOPES; ELECTRIC MODULUS; ELECTRIC MODULUS FORMALISM; HIGH TEMPERATURE RANGE; IMAGINARY PARTS; LINEAR REGION; LOSS TANGENT; METAL INSULATOR SEMICONDUCTOR STRUCTURES; MIS STRUCTURE; TEMPERATURE DEPENDENCE; TEMPERATURE DEPENDENT; TEMPERATURE RANGE;

ACTIVATION ENERGY; DIELECTRIC LOSSES; DIELECTRIC PROPERTIES; METAL INSULATOR BOUNDARIES; MIS DEVICES;

ELECTRIC CONDUCTIVITY;

EID: 84855534191     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2011.07.016     Document Type: Article

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