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Volumn 97, Issue 7, 2006, Pages 934-942

Quantitative microstructural and spectroscopic investigation of inversion domain boundaries in sintered zinc oxide ceramics doped with iron oxide

Author keywords

Annular dark field imaging (Z contrast); Electron energy loss spectroscopy (EELS); Energy filtered transmission electron microscopy (EFTEM); Inversion domain; Zinc oxide (ZnO)

Indexed keywords

CERAMIC MATERIALS; DISSOCIATION; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONS; ENERGY DISPERSIVE SPECTROSCOPY; ENERGY DISSIPATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; II-VI SEMICONDUCTORS; IRON OXIDES; SCANNING ELECTRON MICROSCOPY; SINTERING; ZINC OXIDE; ZINC SULFIDE;

EID: 85125724252     PISSN: 18625282     EISSN: None     Source Type: Journal    
DOI: 10.1515/ijmr-2006-0149     Document Type: Article
Times cited : (20)

References (42)
  • 8
    • 0000811217 scopus 로고
    • T.S. Moss, S. Mahajan (Eds.), North-Holland, Amsterdam
    • T. Dietl, in: T.S. Moss, S. Mahajan (Eds.), Handbook on Semiconductors, Vol. 3b, North-Holland, Amsterdam (1994) 1251.
    • (1994) Handbook on Semiconductors , vol.3 B , pp. 1251
    • Dietl, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.