A study on sputtered Bi-Te thermoelectric films with various compositions: Microstructure evolution and the effects on thermoelectric and electrical properties

Journal of Electronic Materials

Volumn 41, Issue 1, 2012, Pages 60-66

  Oh, Minsub ^a,b   Jeon, Seong Jae ^a,b   Jeon, Haseok ^b   Hyun, Seungmin ^a   Lee, Hoo Jeong ^b  

^a Korea Institute of Machine and Materials   (South Korea)

^b Sungkyunkwan University   (South Korea)

Author keywords

Bi Te thin film; Phase transformation; postannealing; Te composition; thermoelectric materials

Indexed keywords

AS-SPUTTERED FILMS; CO-SPUTTERING DEPOSITION; ELECTRONIC TRANSPORT; MICROSTRUCTURE EVOLUTIONS; PHASE TRANSFORMATION; POST ANNEALING; ROCK-SALT PHASE; THERMOELECTRIC FILM; THERMOELECTRIC MATERIAL; THERMOELECTRIC PROPERTIES;

ELECTRIC PROPERTIES; FILMS; MICROSTRUCTURE; THERMOELECTRIC EQUIPMENT; THERMOELECTRICITY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

PHASE STABILITY;

EID: 84855460417     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-011-1751-5     Document Type: Article

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