Composition-dependent layered structure and transport properties in BiTe thin films

Physical Review B - Condensed Matter and Materials Physics

Volumn 63, Issue 15, 2001, Pages

  Kim, Yunki ^a   Cho, Sunglae ^a,b   DiVenere, Antonio ^a   Wong, George K L ^a,c   Ketterson, J B ^a,d  

^a NORTHWESTERN UNIVERSITY   (United States)

^b University of Ulsan   (South Korea)

^c HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

^d Northwestern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH; TELLURIUM;

ARTICLE; CHEMICAL COMPOSITION; CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; ELECTRON TRANSPORT; SEMICONDUCTOR; TEMPERATURE DEPENDENCE;

EID: 0034899629     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.63.155306     Document Type: Article

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