Including radiation effects and dependencies on process-related variability in advanced foundry SPICE models using a new physical model and parameter extraction approach

IEEE Transactions on Nuclear Science

Volumn 58, Issue 6 PART 1, 2011, Pages 2876-2882

  Li, M ^a   Li, Y F ^a   Wu, Y J ^a   Cai, S ^a   Zhu, N Y ^a   Rezzak, N ^b   Schrimpf, R D ^b   Fleetwood, D M ^b   Wang, J Q ^c   Cheng, X X ^d   Wang, Y ^d   Wang, D L ^c   Hao, Y ^e  

^a Accelicon Technologies Inc   (United States)

^b VANDERBILT UNIVERSITY   (United States)

^c INSTITUTE OF AUTOMATION   (China)

^d TSINGHUA UNIVERSITY   (China)

^e XIDIAN UNIVERSITY   (China)

Author keywords

Process variability; radiation effects; retargeting; SPICE model; total ionizing dose (TID)

Indexed keywords

AUTOMATED FLOW; BULK CMOS; DIFFERENTIAL EVOLUTION ALGORITHMS; FOUNDRY MODEL; GLOBAL EXPLORATION; IRRADIATION CONDITIONS; MEMETIC ALGORITHMS; MULTIPLE OBJECTIVES; OBJECTIVE FUNCTIONS; OPTIMIZERS; PHYSICAL MODEL; PREMATURE CONVERGENCE; PROCESS VARIABILITY; RANDOM PATTERN; RETARGETING; SPICE MODEL; SPICE SIMULATORS; TOTAL IONIZING DOSE; VERILOG-A;

COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; EVOLUTIONARY ALGORITHMS; FOUNDRIES; GLOBAL OPTIMIZATION; IONIZING RADIATION; MODELS; PARAMETER EXTRACTION; SPICE;

RADIATION EFFECTS;

EID: 83855163443     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2011.2171503     Document Type: Conference Paper

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