Structural and morphological characterization of Pr 3+ and Er 3+-containing SiO 2-P 2O 5 sol-gel thin films

Materials Chemistry and Physics

Volumn 131, Issue 3, 2012, Pages 647-665

  Elisa, M ^a   Sava, B A ^b   Vasiliu, I C ^a   Nastase, F ^c   Nastase, C ^c   Volceanov, A ^d   Stoleriu, S ^d  

^a NATIONAL INSTITUTE OF RESEARCH AND DEVELOPMENT FOR OPTOELECTRONICS INOE 2000   (Romania)

^b NATIONAL INSTITUTE FOR LASER   (Romania)

^c UNIVERSITY OF BUCHAREST   (Romania)

^d UNIVERSITY POLITEHNICA OF BUCHAREST   (Romania)

Author keywords

Atomic force microscopy; Electron microscopy; Sol gel growth; Thin films

Indexed keywords

AFM; ELECTRONIC TRANSITION; FT-IR SPECTRUM; FTIR; MORPHOLOGICAL CHARACTERIZATION; OPTICAL PHONONS; PRECURSOR SOLS; RAMAN CHARACTERIZATION; RARE EARTH IONS; ROTATION SPEED; SOL-GEL GROWTH; SOL-GEL THIN FILMS; SOLGEL FILMS; SPIN RATE; STRUCTURAL CHANGE; STRUCTURAL UNIT; TIME-PERIODS; VIBRATION MODES;

ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; CRYSTAL ATOMIC STRUCTURE; ELECTRON MICROSCOPY; ERBIUM; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GELS; SCANNING ELECTRON MICROSCOPY; SILICON; SILICON COMPOUNDS; SOL-GEL PROCESS; SOL-GELS; SOLS; SPHERES; THIN FILMS; VAPOR DEPOSITION; VIBRATING CONVEYORS;

FILM PREPARATION;

EID: 83555160960     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2011.10.031     Document Type: Article

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