Structural and thermal characterization of SiO2-P2O5 sol-gel powders upon annealing at high temperatures

Journal of Non-Crystalline Solids

Volumn 356, Issue 9-10, 2010, Pages 495-501

  Elisa, M ^a   Sava, B A ^b   Volceanov, A ^c   Monteiro, R C C ^d   Alves, E ^e   Franco, N ^e   Costa Oliveira, F A ^f   Fernandes, H ^g   Ferro, M C ^g  

^a NATIONAL INSTITUTE FOR OPTOELECTRONICS   (Romania)

^b NATIONAL INSTITUTE FOR LASER   (Romania)

^c UNIVERSITY POLITEHNICA OF BUCHAREST   (Romania)

^d UNIVERSIDADE NOVA DE LISBOA   (Portugal)

^e Technological and Nuclear Institute   (Portugal)

^f LABORATÓRIO NACIONAL DE ENERGIA E GEOLOGIA   (Portugal)

^g UNIVERSITY OF AVEIRO   (Portugal)

Author keywords

Glass transition; Phosphates; Scanning electron microscopy; Silicates; Sol gels (xerogels); X ray diffraction

Indexed keywords

ALKYL AMINES; ANNEALING TEMPERATURES; CRISTOBALITES; CRYSTALLINE PHASIS; ENDOTHERMIC EFFECTS; HIGH TEMPERATURE; SEM ANALYSIS; SEM IMAGE; SOL-GELS (XEROGELS); TETRAETHOXYSILANES; THERMAL CHARACTERIZATION; TRIETHYLPHOSPHATE; WEIGHT LOSS; XRD; XRD ANALYSIS;

ANNEALING; ARGON; CERAMIC MATERIALS; CRYSTALLINE MATERIALS; DIFFRACTION; EVAPORATION; GLASS; GLASS TRANSITION; PHOSPHATES; PHOSPHORIC ACID; SCANNING ELECTRON MICROSCOPY; SILICATE MINERALS; SILICON COMPOUNDS; SOL-GEL PROCESS; SOLS; VAPORS; X RAY DIFFRACTION; XEROGELS;

SOL-GELS;

EID: 76549126026     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2009.12.006     Document Type: Article

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