SoftBeam: Precise tracking of transient faults and vulnerability analysis at processor design time

Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors

Volumn , Issue , 2011, Pages 404-410

  Gschwind, Michael ^a   Salapura, Valentina ^a   Trammell, Catherine ^a   McKee, Sally A ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

DATA CORRUPTION; DESIGN DATA; DESIGN VULNERABILITIES; EXECUTION UNITS; MEMORY MANAGEMENT UNIT; MICROPROCESSOR DESIGNS; MICROPROCESSOR VERIFICATION; PERFORMANCE DEGRADATION; PROCESSOR DESIGN; SOFT ERROR; SYSTEM RELIABILITY; TRANSIENT FAULTS; VULNERABILITY ANALYSIS;

DESIGN; ERROR CORRECTION; RELIABILITY ANALYSIS;

MICROPROCESSOR CHIPS;

EID: 83455219845     PISSN: 10636404     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCD.2011.6081430     Document Type: Conference Paper

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