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Volumn , Issue , 2008, Pages 155-164

Soft error vulnerability of iterative linear algebra methods

Author keywords

Fault tolerance; Iterative methods; Linear algebra; Parallel; Soft errors

Indexed keywords

ALGEBRA; COMPUTERS; ERROR DETECTION; ERRORS; FAULT TOLERANCE; INTELLIGENT CONTROL; ITERATIVE METHODS; MATRIX ALGEBRA; MICROPROCESSOR CHIPS; NUMERICAL ANALYSIS; QUALITY ASSURANCE; RELIABILITY; SUPERCOMPUTERS;

EID: 57349156147     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1375527.1375552     Document Type: Conference Paper
Times cited : (120)

References (34)
  • 1
    • 0004098468 scopus 로고    scopus 로고
    • International Technology Roadmap for Semiconductors, ITRS
    • International Technology Roadmap for Semiconductors. White paper, ITRS, 2005.
    • (2005) White paper
  • 2
    • 57349116549 scopus 로고    scopus 로고
    • JESD89A: Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices. Technical standard, JEDEC Solid State Technology Association, October 2006.
    • JESD89A: Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices. Technical standard, JEDEC Solid State Technology Association, October 2006.
  • 3
    • 0024142081 scopus 로고
    • A Linear Algebraic Model of Algorithm-Based Fault Tolerance
    • December
    • C.J. Anfinson and F.T. Luk. A Linear Algebraic Model of Algorithm-Based Fault Tolerance. IEEE Transactions on Computers, 37(12):1599-1604, December 1995.
    • (1995) IEEE Transactions on Computers , vol.37 , Issue.12 , pp. 1599-1604
    • Anfinson, C.J.1    Luk, F.T.2
  • 4
  • 5
    • 29344472607 scopus 로고    scopus 로고
    • Radiation-Induced Soft Errors in Advanced Semiconductor Technologies
    • September
    • R. C. Baumann. Radiation-Induced Soft Errors in Advanced Semiconductor Technologies. IEEE Transactions on Device and Materials Reliability, 5(3):305-316, September 2005.
    • (2005) IEEE Transactions on Device and Materials Reliability , vol.5 , Issue.3 , pp. 305-316
    • Baumann, R.C.1
  • 7
    • 84934311843 scopus 로고    scopus 로고
    • Charng da Lu and Daniel A Reed. Assessing Fault Sensitivity in MPI Applications. In Supercomputing, November 2004.
    • Charng da Lu and Daniel A Reed. Assessing Fault Sensitivity in MPI Applications. In Supercomputing, November 2004.
  • 8
    • 0003197949 scopus 로고    scopus 로고
    • University of Florida Sparse Matrix Collection
    • June
    • Tim Davis. University of Florida Sparse Matrix Collection. NA Digest, 97(23), June 1997.
    • (1997) NA Digest , vol.97 , Issue.23
    • Davis, T.1
  • 10
    • 0029732375 scopus 로고    scopus 로고
    • IBM Experiments in Soft Fails in Computer Electronics (1978-1994)
    • J.F. Ziegler et al. IBM Experiments in Soft Fails in Computer Electronics (1978-1994). IBM Journal of Research and Development, 40(1), 1996.
    • (1996) IBM Journal of Research and Development , vol.40 , Issue.1
    • Ziegler, J.F.1
  • 13
    • 0033332609 scopus 로고    scopus 로고
    • Single Event Upset Characterization of the Pentium MMX and Pentium II Microprocessors Using Proton
    • December
    • David M. Hiemstra and Allan Baril. Single Event Upset Characterization of the Pentium MMX and Pentium II Microprocessors Using Proton. IEEE Transactions on Nuclear Science, 46(6):1453-1460, December 1999.
    • (1999) IEEE Transactions on Nuclear Science , vol.46 , Issue.6 , pp. 1453-1460
    • Hiemstra, D.M.1    Baril, A.2
  • 14
    • 0021439162 scopus 로고
    • Algorithm-Based Fault Tolerance for Matrix Operations
    • June
    • K.H. Huang and J.A. Abraham. Algorithm-Based Fault Tolerance for Matrix Operations. IEEE Transactions on Computers, 33:518-528, June 1984.
    • (1984) IEEE Transactions on Computers , vol.33 , pp. 518-528
    • Huang, K.H.1    Abraham, J.A.2
  • 16
    • 55549096750 scopus 로고    scopus 로고
    • Recovery Patterns for Iterative Methods in a Parallel Unstable Environment
    • November
    • J. Langou, Z. Chen, G. Bosilca, and J. Dongarra. Recovery Patterns for Iterative Methods in a Parallel Unstable Environment. SIAM Journal on Scientific Computing, 30(1):102-116, November 2007.
    • (2007) SIAM Journal on Scientific Computing , vol.30 , Issue.1 , pp. 102-116
    • Langou, J.1    Chen, Z.2    Bosilca, G.3    Dongarra, J.4
  • 17
    • 34548087240 scopus 로고    scopus 로고
    • The Rosetta Experiment: Atmospheric Soft Error Rate Testing in Differing Technology FPGAs - 90 Nanometer Update
    • April
    • Austin Lesea and Joe Fabula. The Rosetta Experiment: Atmospheric Soft Error Rate Testing in Differing Technology FPGAs - 90 Nanometer Update. In Workshop on System Effects of Logic Soft Errors, April 2005.
    • (2005) Workshop on System Effects of Logic Soft Errors
    • Lesea, A.1    Fabula, J.2
  • 20
    • 57349118201 scopus 로고    scopus 로고
    • PC603E 32-Bit RISC Microprocessor Radiation Effects Study
    • Innovative Concepts Inc
    • P.T. McDonald, W.J. Stapor, and B.G. Henson. PC603E 32-Bit RISC Microprocessor Radiation Effects Study. White paper, Innovative Concepts Inc., 1999.
    • (1999) White paper
    • McDonald, P.T.1    Stapor, W.J.2    Henson, B.G.3
  • 29
    • 57349118200 scopus 로고    scopus 로고
    • Terrazon Semiconductor. Soft Errors in Electronic Memory. White paper, Terrazon Semiconductor, 2004.
    • Terrazon Semiconductor. Soft Errors in Electronic Memory. White paper, Terrazon Semiconductor, 2004.
  • 33
    • 33846616901 scopus 로고    scopus 로고
    • Dependability Evaluation of Altera FPGA-Based Embedded Systems Subjected to SEUs
    • Hamid R. Zarandi and Seyed Ghassem Miremadi. Dependability Evaluation of Altera FPGA-Based Embedded Systems Subjected to SEUs. Microelectronics and Reliability, 47(2-3):461-470, 2006.
    • (2006) Microelectronics and Reliability , vol.47 , Issue.2-3 , pp. 461-470
    • Zarandi, H.R.1    Ghassem Miremadi, S.2
  • 34
    • 0028201493 scopus 로고
    • An Efficient Method to Reduce Roundoff Error in Matrix Multiplication with Algorithm-Based Fault Tolerance
    • January
    • Qihong Zhang and Jung H. Kim. An Efficient Method to Reduce Roundoff Error in Matrix Multiplication with Algorithm-Based Fault Tolerance. In International Conference on Wafer Scale Integration, pages 32-39, January 1994.
    • (1994) International Conference on Wafer Scale Integration , pp. 32-39
    • Zhang, Q.1    Kim, J.H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.