-
1
-
-
0004098468
-
-
International Technology Roadmap for Semiconductors, ITRS
-
International Technology Roadmap for Semiconductors. White paper, ITRS, 2005.
-
(2005)
White paper
-
-
-
2
-
-
57349116549
-
-
JESD89A: Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices. Technical standard, JEDEC Solid State Technology Association, October 2006.
-
JESD89A: Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices. Technical standard, JEDEC Solid State Technology Association, October 2006.
-
-
-
-
3
-
-
0024142081
-
A Linear Algebraic Model of Algorithm-Based Fault Tolerance
-
December
-
C.J. Anfinson and F.T. Luk. A Linear Algebraic Model of Algorithm-Based Fault Tolerance. IEEE Transactions on Computers, 37(12):1599-1604, December 1995.
-
(1995)
IEEE Transactions on Computers
, vol.37
, Issue.12
, pp. 1599-1604
-
-
Anfinson, C.J.1
Luk, F.T.2
-
4
-
-
0141836929
-
Comparison of Physical and Software-Implemented Fault Injection Techniques
-
December
-
Jean Arlat, Yves Crouzet, Johan Karlsson, Peter Folkesson, Emmerich Fuchs, and Gunther H. Leber. Comparison of Physical and Software-Implemented Fault Injection Techniques. IEEE Transactions on Computers, 52(9):1115-1133, December 2003.
-
(2003)
IEEE Transactions on Computers
, vol.52
, Issue.9
, pp. 1115-1133
-
-
Arlat, J.1
Crouzet, Y.2
Karlsson, J.3
Folkesson, P.4
Fuchs, E.5
Leber, G.H.6
-
5
-
-
29344472607
-
Radiation-Induced Soft Errors in Advanced Semiconductor Technologies
-
September
-
R. C. Baumann. Radiation-Induced Soft Errors in Advanced Semiconductor Technologies. IEEE Transactions on Device and Materials Reliability, 5(3):305-316, September 2005.
-
(2005)
IEEE Transactions on Device and Materials Reliability
, vol.5
, Issue.3
, pp. 305-316
-
-
Baumann, R.C.1
-
6
-
-
0001092980
-
Algorithmic Fault Tolerance Using the Lanczos Method
-
January
-
Daniel L. Boley, Richard P. Brent, Gene H. Golub, and Franklin T. Luk. Algorithmic Fault Tolerance Using the Lanczos Method. SIAM Journal on Matrix Analysis and Applicationsv, 13(1):312 - 332, January 1992.
-
(1992)
SIAM Journal on Matrix Analysis and Applicationsv
, vol.13
, Issue.1
, pp. 312-332
-
-
Boley, D.L.1
Brent, R.P.2
Golub, G.H.3
Luk, F.T.4
-
7
-
-
84934311843
-
-
Charng da Lu and Daniel A Reed. Assessing Fault Sensitivity in MPI Applications. In Supercomputing, November 2004.
-
Charng da Lu and Daniel A Reed. Assessing Fault Sensitivity in MPI Applications. In Supercomputing, November 2004.
-
-
-
-
8
-
-
0003197949
-
University of Florida Sparse Matrix Collection
-
June
-
Tim Davis. University of Florida Sparse Matrix Collection. NA Digest, 97(23), June 1997.
-
(1997)
NA Digest
, vol.97
, Issue.23
-
-
Davis, T.1
-
9
-
-
0005020693
-
A Sparse Matrix Library in C++ for High Performance Architectures
-
J. Dongarra, A. Lumsdaine, R. Pozo, and K. Remington. A Sparse Matrix Library in C++ for High Performance Architectures. In Object Oriented Numerics Conference, pages 214-218, 1994.
-
(1994)
Object Oriented Numerics Conference
, pp. 214-218
-
-
Dongarra, J.1
Lumsdaine, A.2
Pozo, R.3
Remington, K.4
-
10
-
-
0029732375
-
IBM Experiments in Soft Fails in Computer Electronics (1978-1994)
-
J.F. Ziegler et al. IBM Experiments in Soft Fails in Computer Electronics (1978-1994). IBM Journal of Research and Development, 40(1), 1996.
-
(1996)
IBM Journal of Research and Development
, vol.40
, Issue.1
-
-
Ziegler, J.F.1
-
12
-
-
57349088494
-
Raptor: Software and Applications on BlueGene/L
-
October
-
J. Greenough, L. Howell A. Kuhl, A. Shestakov, U. Creach, A. Miller, E. Tarwater, A. Cook, and B. Cabot. Raptor: Software and Applications on BlueGene/L, In BlueGene/L Workshop, October 2003.
-
(2003)
BlueGene/L Workshop
-
-
Greenough, J.1
Howell, L.2
Kuhl, A.3
Shestakov, A.4
Creach, U.5
Miller, A.6
Tarwater, E.7
Cook, A.8
Cabot, B.9
-
13
-
-
0033332609
-
Single Event Upset Characterization of the Pentium MMX and Pentium II Microprocessors Using Proton
-
December
-
David M. Hiemstra and Allan Baril. Single Event Upset Characterization of the Pentium MMX and Pentium II Microprocessors Using Proton. IEEE Transactions on Nuclear Science, 46(6):1453-1460, December 1999.
-
(1999)
IEEE Transactions on Nuclear Science
, vol.46
, Issue.6
, pp. 1453-1460
-
-
Hiemstra, D.M.1
Baril, A.2
-
14
-
-
0021439162
-
Algorithm-Based Fault Tolerance for Matrix Operations
-
June
-
K.H. Huang and J.A. Abraham. Algorithm-Based Fault Tolerance for Matrix Operations. IEEE Transactions on Computers, 33:518-528, June 1984.
-
(1984)
IEEE Transactions on Computers
, vol.33
, pp. 518-528
-
-
Huang, K.H.1
Abraham, J.A.2
-
15
-
-
57349086833
-
Soft Error Derating of IBM POWER6 Microprocessor Using Statistical Fault Injection
-
April
-
P. Kudva, Jeffrey W. Kellington, Pia N. Sanda, Ryan McBeth, John Schumann, and Ron Kalla. Soft Error Derating of IBM POWER6 Microprocessor Using Statistical Fault Injection. In IEEE Workshop on Silicon Errors in Logic - System, Effects, April 2007.
-
(2007)
IEEE Workshop on Silicon Errors in Logic - System, Effects
-
-
Kudva, P.1
Kellington, J.W.2
Sanda, P.N.3
McBeth, R.4
Schumann, J.5
Kalla, R.6
-
16
-
-
55549096750
-
Recovery Patterns for Iterative Methods in a Parallel Unstable Environment
-
November
-
J. Langou, Z. Chen, G. Bosilca, and J. Dongarra. Recovery Patterns for Iterative Methods in a Parallel Unstable Environment. SIAM Journal on Scientific Computing, 30(1):102-116, November 2007.
-
(2007)
SIAM Journal on Scientific Computing
, vol.30
, Issue.1
, pp. 102-116
-
-
Langou, J.1
Chen, Z.2
Bosilca, G.3
Dongarra, J.4
-
17
-
-
34548087240
-
The Rosetta Experiment: Atmospheric Soft Error Rate Testing in Differing Technology FPGAs - 90 Nanometer Update
-
April
-
Austin Lesea and Joe Fabula. The Rosetta Experiment: Atmospheric Soft Error Rate Testing in Differing Technology FPGAs - 90 Nanometer Update. In Workshop on System Effects of Logic Soft Errors, April 2005.
-
(2005)
Workshop on System Effects of Logic Soft Errors
-
-
Lesea, A.1
Fabula, J.2
-
19
-
-
57349096118
-
ALE3D Model Predictions and Materials Characterization for the Cookoff Response
-
March
-
M. A. McClelland, J. L. Maienschein, A. L. Nichols, J. F. Wardell, A. I. Atwood, and P. O. Curran. ALE3D Model Predictions and Materials Characterization for the Cookoff Response. In Joint Army Navy NASA Air Force 38th Combustions Subcommittee, 26th Airbreathing Propulsion Subcommittee, 20th Propulsion Systems Hazards Subcommittee and 2nd Modeling and Simulation Subcommittee Joint Meeting, March 2007.
-
(2007)
Joint Army Navy NASA Air Force 38th Combustions Subcommittee, 26th Airbreathing Propulsion Subcommittee, 20th Propulsion Systems Hazards Subcommittee and 2nd Modeling and Simulation Subcommittee Joint Meeting
-
-
McClelland, M.A.1
Maienschein, J.L.2
Nichols, A.L.3
Wardell, J.F.4
Atwood, A.I.5
Curran, P.O.6
-
20
-
-
57349118201
-
PC603E 32-Bit RISC Microprocessor Radiation Effects Study
-
Innovative Concepts Inc
-
P.T. McDonald, W.J. Stapor, and B.G. Henson. PC603E 32-Bit RISC Microprocessor Radiation Effects Study. White paper, Innovative Concepts Inc., 1999.
-
(1999)
White paper
-
-
McDonald, P.T.1
Stapor, W.J.2
Henson, B.G.3
-
21
-
-
11244319500
-
Susceptibility of Commodity Systems and Software to Memory Soft Errors
-
December
-
A. Messer, P. Bernadat, G. Fu, D. Chen, Z. Dimitrijevic, D. Lie, D.D. Mannaru, A. Riska, and D Milojicic. Susceptibility of Commodity Systems and Software to Memory Soft Errors. IEEE Transactions on Computers, 53(12):1557 - 1568, December 2004.
-
(2004)
IEEE Transactions on Computers
, vol.53
, Issue.12
, pp. 1557-1568
-
-
Messer, A.1
Bernadat, P.2
Fu, G.3
Chen, D.4
Dimitrijevic, Z.5
Lie, D.6
Mannaru, D.D.7
Riska, A.8
Milojicic, D.9
-
22
-
-
29344473319
-
Predicting the Number of Fatal Soft Errors in Los Alamos National Laboratory's ASC Q Supercomputer
-
Sarah Michalak, Kevin W. Harris, Nicolas W. Hengartner, Bruce E. Takala, and Stephen A. Wender. Predicting the Number of Fatal Soft Errors in Los Alamos National Laboratory's ASC Q Supercomputer. IEEE Transactions on Device and Materials Reliability, 5(3), 2005.
-
(2005)
IEEE Transactions on Device and Materials Reliability
, vol.5
, Issue.3
-
-
Michalak, S.1
Harris, K.W.2
Hengartner, N.W.3
Takala, B.E.4
Wender, S.A.5
-
29
-
-
57349118200
-
-
Terrazon Semiconductor. Soft Errors in Electronic Memory. White paper, Terrazon Semiconductor, 2004.
-
Terrazon Semiconductor. Soft Errors in Electronic Memory. White paper, Terrazon Semiconductor, 2004.
-
-
-
-
30
-
-
0036931372
-
Modeling the Effect of Technology Trends on the Soft Error Rate of Combinational Logic
-
June
-
P. Shivakumar, M. Kistler, S. W. Keckler, D. Burger, and L. Alvisi. Modeling the Effect of Technology Trends on the Soft Error Rate of Combinational Logic. In International Conference on Dependable Systems and Networks, pages 389-398, June 2002.
-
(2002)
International Conference on Dependable Systems and Networks
, pp. 389-398
-
-
Shivakumar, P.1
Kistler, M.2
Keckler, S.W.3
Burger, D.4
Alvisi, L.5
-
33
-
-
33846616901
-
Dependability Evaluation of Altera FPGA-Based Embedded Systems Subjected to SEUs
-
Hamid R. Zarandi and Seyed Ghassem Miremadi. Dependability Evaluation of Altera FPGA-Based Embedded Systems Subjected to SEUs. Microelectronics and Reliability, 47(2-3):461-470, 2006.
-
(2006)
Microelectronics and Reliability
, vol.47
, Issue.2-3
, pp. 461-470
-
-
Zarandi, H.R.1
Ghassem Miremadi, S.2
-
34
-
-
0028201493
-
An Efficient Method to Reduce Roundoff Error in Matrix Multiplication with Algorithm-Based Fault Tolerance
-
January
-
Qihong Zhang and Jung H. Kim. An Efficient Method to Reduce Roundoff Error in Matrix Multiplication with Algorithm-Based Fault Tolerance. In International Conference on Wafer Scale Integration, pages 32-39, January 1994.
-
(1994)
International Conference on Wafer Scale Integration
, pp. 32-39
-
-
Zhang, Q.1
Kim, J.H.2
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