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Volumn , Issue , 2003, Pages 1000-1005

A new approach to test generation and test compaction for scan circuits

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARK CIRCUIT; PRIMARY INPUT VECTORS; PRIMARY INPUTS; PRIMARY OUTPUTS; SCAN OPERATIONS; TEST APPLICATIONS; TEST COMPACTION; TEST GENERATIONS;

EID: 8344240295     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2003.1253735     Document Type: Conference Paper
Times cited : (17)

References (26)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.