Static compaction using overlapped restoration and segment pruning

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 1998, Pages 140-146

  Bommu, Surendra K ^a   Chakradhar, Srimat T ^a   Doreswamy, Kiran B ^a  

^a NEC LABORATORIES AMERICA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; IMAGE RECONSTRUCTION; IMAGE SEGMENTATION; PRODUCT DESIGN; VECTORS;

SEGMENT PRUNING;

IMAGE ANALYSIS;

EID: 0032306487     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/288548.288592     Document Type: Conference Paper

References (16)