Microscopic structure of a VH4 center trapped by C in Si

Physical Review B - Condensed Matter and Materials Physics

Volumn 84, Issue 19, 2011, Pages

  Peng, Chao ^a   Zhang, Haoxiang ^a   Stavola, Michael ^a   Fowler, W Beall ^a   Esham, Benjamin ^a,e   Estreicher, Stefan K ^b   Docaj, Andris ^b   Carnel, Lode ^c   Seacrist, Mike ^d  

^a LEHIGH UNIVERSITY   (United States)

^b TEXAS TECH UNIVERSITY   (United States)

^c REC Wafer AS   (Norway)

^d MEMC Electronic Materials Inc   (United States)

^e University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 82655185170     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.84.195205     Document Type: Article

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