메뉴 건너뛰기




Volumn , Issue , 2011, Pages 4029-4034

Capacitor voltage balancing control based on CPS-PWM of modular multilevel converter

Author keywords

Capacitor Voltage Balancing Control; CPS PWM; Modular Multilevel Converter

Indexed keywords

ACTIVE POWER; CAPACITOR VOLTAGE BALANCING; CAPACITOR VOLTAGES; CONTROL STRATEGIES; CPS-PWM; DC CAPACITOR; DC VOLTAGE; DYNAMIC STATE; HIGH-CAPACITY; HIGH-VOLTAGE DIRECT-CURRENT TRANSMISSION SYSTEMS; MODULAR MULTILEVEL CONVERTERS; VOLTAGE BALANCING CONTROL; VOLTAGE SOURCE CONVERTERS; VSC-HVDC;

EID: 81855161384     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECCE.2011.6064317     Document Type: Conference Paper
Times cited : (58)

References (36)
  • 3
    • 70350749279 scopus 로고    scopus 로고
    • Multilevel converters: An enabling technology for high-power applications
    • Nov.
    • J. Rodriguez, L. Franquelo, S. Kouro, J. I. Leon, R. C. Portillo, M. A. M. Prats, and M. A. Perez, "Multilevel converters: An enabling technology for high-power applications," Proc. IEEE, vol. 97, no. 11, pp. 1786-1817, Nov. 2009.
    • (2009) Proc. IEEE , vol.97 , Issue.11 , pp. 1786-1817
    • Rodriguez, J.1    Franquelo, L.2    Kouro, S.3    Leon, J.I.4    Portillo, R.C.5    Prats, M.A.M.6    Perez, M.A.7
  • 4
    • 56649097063 scopus 로고    scopus 로고
    • Power electronics and motor drives in electric, hybrid electric, and plug-in hybrid electric vehicles
    • A. Emadi, J. L. Young, and K. Rajashekara, "Power electronics and motor drives in electric, hybrid electric, and plug-in hybrid electric vehicles," IEEE Trans. Power Electron., vol. 55, no. 6, pp. 2237-2245, 2008.
    • (2008) IEEE Trans. Power Electron. , vol.55 , Issue.6 , pp. 2237-2245
    • Emadi, A.1    Young, J.L.2    Rajashekara, K.3
  • 9
    • 0027660696 scopus 로고
    • A strategy for improving reliability of field-oriented controlled induction motor drives
    • Sep/Oct
    • T.-H. Liu, J.-R. Fen, and T. A. Lipo, "A strategy for improving reliability of field-oriented controlled induction motor drives," IEEE Trans. Ind. Appl., vol. 29, no. 5, pp. 910-918, Sep/Oct 1993.
    • (1993) IEEE Trans. Ind. Appl. , vol.29 , Issue.5 , pp. 910-918
    • Liu, T.-H.1    Fen, J.-R.2    Lipo, T.A.3
  • 10
    • 0037363162 scopus 로고    scopus 로고
    • Fault detection of open-switch damage in voltage-fed PWM motor drive systems
    • Mar.
    • R. Ribeiro, C. B. Jacobina, E. da Silva, and A. Lima, "Fault detection of open-switch damage in voltage-fed PWM motor drive systems," IEEE Trans. Power Electron., vol. 18, no. 2, pp. 587-593, Mar. 2003.
    • (2003) IEEE Trans. Power Electron. , vol.18 , Issue.2 , pp. 587-593
    • Ribeiro, R.1    Jacobina, C.B.2    Da Silva, E.3    Lima, A.4
  • 11
    • 0028445714 scopus 로고
    • A novel scheme for protection of power semiconductor devices against short circuit faults
    • Jun
    • A. K. Kharegakar and P. Pavana Kumar, "A novel scheme for protection of power semiconductor devices against short circuit faults," IEEE Trans. Ind. Electron., vol. 41, no. 3, pp. 344-351, Jun 1994.
    • (1994) IEEE Trans. Ind. Electron. , vol.41 , Issue.3 , pp. 344-351
    • Kharegakar, A.K.1    Pavana Kumar, P.2
  • 12
    • 0032124093 scopus 로고    scopus 로고
    • Analysis and simulation of five-phase variable-speed induction motor drives under asymmetrical connections
    • Jul.
    • H. A. Toliyat, "Analysis and simulation of five-phase variable-speed induction motor drives under asymmetrical connections," IEEE Trans. Power Electron., vol. 13, no. 4, pp. 748-756, Jul. 1998.
    • (1998) IEEE Trans. Power Electron. , vol.13 , Issue.4 , pp. 748-756
    • Toliyat, H.A.1
  • 13
    • 79958261052 scopus 로고    scopus 로고
    • Reliability improvements in integrated power systems with pressure-contact semiconductors
    • Apr
    • N. D. Benavides, T. J. McCoy, and M. A. Chrin, "Reliability improvements in integrated power systems with pressure-contact semiconductors,"in Proc. ASNE Day, Apr 2009.
    • (2009) Proc. ASNE Day
    • Benavides, N.D.1    McCoy, T.J.2    Chrin, M.A.3
  • 14
    • 0036540853 scopus 로고    scopus 로고
    • Selected failure mechanisms of modern power modules
    • Jan
    • M. Ciappa, "Selected failure mechanisms of modern power modules,"Microelectronics Reliability, no. 42, pp. 653-667, Jan 2002.
    • (2002) Microelectronics Reliability , Issue.42 , pp. 653-667
    • Ciappa, M.1
  • 16
    • 57949090034 scopus 로고    scopus 로고
    • An agile accelerated aging, characterization and scenario simulation system for gate controlled power transistors
    • Sept.
    • G. Sonnenfeld, K. Goebel, and J. R. Celaya, "An agile accelerated aging, characterization and scenario simulation system for gate controlled power transistors," in Proc of IEEE AUTOTESTCON, Salt Lake City, UT, Sept. 2008, pp. 208-215.
    • (2008) Proc of IEEE AUTOTESTCON, Salt Lake City, UT , pp. 208-215
    • Sonnenfeld, G.1    Goebel, K.2    Celaya, J.R.3
  • 17
    • 0032777935 scopus 로고    scopus 로고
    • Failure mechanisms of IGBTs under short-circuit and clamped inductive switching stress
    • Jan.
    • M. Trivedi and K. Shenai, "Failure mechanisms of IGBTs under short-circuit and clamped inductive switching stress," IEEE Trans. Power Electron., vol. 14, no. 1, pp. 108-116, Jan. 1999.
    • (1999) IEEE Trans. Power Electron. , vol.14 , Issue.1 , pp. 108-116
    • Trivedi, M.1    Shenai, K.2
  • 20
    • 84937650904 scopus 로고
    • Electromigration - A brief survey and some recent results
    • April
    • J. R. Black, "Electromigration - a brief survey and some recent results,"IEEE Trans. Electron Devices, vol. 16, no. 4, pp. 338-347, April 1969.
    • (1969) IEEE Trans. Electron Devices , vol.16 , Issue.4 , pp. 338-347
    • Black, J.R.1
  • 24
    • 0242337588 scopus 로고    scopus 로고
    • Void-induced thermal impedance in power semiconductor modules: Some transient temperature effects
    • Sept. / Oct.
    • D. Katsis and J. van Wyk, "Void-induced thermal impedance in power semiconductor modules: Some transient temperature effects," IEEE Trans. Ind. Appl., vol. 39, no. 5, pp. 1239-1246, Sept. / Oct. 2003.
    • (2003) IEEE Trans. Ind. Appl. , vol.39 , Issue.5 , pp. 1239-1246
    • Katsis, D.1    Van Wyk, J.2
  • 25
    • 0003698025 scopus 로고
    • McGraw-Hill Book Company, Inc.
    • J. D. Kraus, Electromagnetics. McGraw-Hill Book Company, Inc., 1953.
    • (1953) Electromagnetics
    • Kraus, J.D.1
  • 26
  • 27
    • 0035279716 scopus 로고    scopus 로고
    • Prognostic methodology for deep submicron semiconductor failure modes
    • March
    • D. L. Goodman, "Prognostic methodology for deep submicron semiconductor failure modes," IEEE Trans. on Components and Packaging Technologies, vol. 24, no. 1, pp. 109-111, March 2001.
    • (2001) IEEE Trans. on Components and Packaging Technologies , vol.24 , Issue.1 , pp. 109-111
    • Goodman, D.L.1
  • 28
    • 0033147361 scopus 로고    scopus 로고
    • Reliability and lifetime evaluation of different wire bonding technologies for high power IGBT modules
    • A. Hamidi, N. Beck, K. Thomas, and E. Herr, "Reliability and lifetime evaluation of different wire bonding technologies for high power IGBT modules," Microelectronics Reliability, no. 39, pp. 1153-1158, 1999. (Pubitemid 129304848)
    • (1999) Microelectronics Reliability , vol.39 , Issue.6-7 , pp. 1153-1158
    • Hamidi, A.1    Beck, N.2    Thomas, K.3    Herr, E.4
  • 29
    • 36249028598 scopus 로고    scopus 로고
    • Comparison of 2.3-kV medium-voltage multilevel converters for industrial medium-voltage drives
    • DOI 10.1109/TIE.2007.906997
    • D. Krug, S. Bernet, S. Fazel, K. Jalili, and M. Malinowski, "Comparison of 2.3-kv medium-voltage multilevel converters for industrial medium voltage drives," IEEE Trans. Ind. Electron., vol. 54, no. 6, pp. 2979-2992, Dec. 2007. (Pubitemid 350130682)
    • (2007) IEEE Transactions on Industrial Electronics , vol.54 , Issue.6 , pp. 2979-2992
    • Krug, D.1    Bernet, S.2    Fazel, S.S.3    Jalili, K.4    Malinowski, M.5
  • 35
    • 0028482817 scopus 로고
    • Pulsewidth modulation for electronic power conversion
    • Aug
    • J. Holtz, "Pulsewidth modulation for electronic power conversion," Proc. IEEE, vol. 82, no. 8, pp. 1194-1214, Aug 1994.
    • (1994) Proc. IEEE , vol.82 , Issue.8 , pp. 1194-1214
    • Holtz, J.1
  • 36
    • 79958287673 scopus 로고    scopus 로고
    • International Rectifier, Tech. Rep.
    • "IRF540N HEXFET power MOSFET," International Rectifier, Tech. Rep., 2001.
    • (2001) IRF540N HEXFET Power MOSFET


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.