Determination of real space residual stress distributions σij(z) of surface treated materials with diffraction methods Part II: Energy dispersive approach

Materials Science Forum

Volumn 524-525, Issue , 2006, Pages 37-42

  Denks, I A ^a   Klaus, M ^a   Genzel, Ch ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

Depth resolved residual stress analysis; Energy dispersive diffraction; Real space method

Indexed keywords

MULTILAYERS; RESIDUAL STRESSES; X RAY DIFFRACTION ANALYSIS;

DEPTH-RESOLVED RESIDUAL STRESS ANALYSIS; ENERGY DISPERSIVE DIFFRACTION; REAL SPACE METHOD;

SURFACE TREATMENT;

EID: 34347332158     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-414-6.37     Document Type: Conference Paper

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