A deconvolution method for the reconstruction of underlying profiles measured using large sampling volumes

Journal of Applied Crystallography

Volumn 39, Issue 3, 2006, Pages 410-424

  Xiong, Y S ^a   Withers, P J ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33744491288     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889806012210     Document Type: Article

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