Low-temperature formation of nanocrystalline SiC particles and composite from three-layer Si/C/Si film for the novel enhanced white photoluminescence

Journal of Nanoparticle Research

Volumn 13, Issue 10, 2011, Pages 4821-4828

  Chung, C K ^a   Chen, T Y ^a   Lai, C W ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

Composite; Nanolayers; Nanoparticles; nc SiC; Photoluminescence; RTA

Indexed keywords

ANNEALING TEMPERATURES; COMPOSITE; DRIVING FORCES; FIELD EMISSION SCANNING ELECTRON MICROSCOPES; FOURIER TRANSFORM INFRARED SPECTROMETER; HIGH RESOLUTION; LOW TEMPERATURE FORMATION; MATRIX; NANO LAYERS; NANOCRYSTALLINES; NC-SIC; PARTICLE DENSITIES; SI (100) SUBSTRATE; SI NANOCRYSTAL; SIC PARTICLES; THERMAL FORMATION; THERMAL REACTIONS; THREE-LAYER; THREE-LAYER FILM; ULTRA-HIGH-VACUUM ION BEAM SPUTTERING; VISIBLE PHOTOLUMINESCENCE;

AMORPHOUS SILICON; ANNEALING; CARBON CLUSTERS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; FOURIER TRANSFORMS; HIGH RESOLUTION ELECTRON MICROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MICROSTRUCTURAL EVOLUTION; MULTILAYERS; NANOCRYSTALLINE SILICON; NANOCRYSTALS; NANOPARTICLES; PHOTOLUMINESCENCE; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDE; SPECTROMETERS; TRANSMISSION ELECTRON MICROSCOPY;

NANOCOMPOSITE FILMS;

NANOCOMPOSITE; NANOCRYSTAL; NANOPARTICLE; SILICON CARBIDE;

ARTICLE; CHEMICAL ANALYSIS; CHEMICAL REACTION; COMPOSITE MATERIAL; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; FILM; INFRARED SPECTROMETRY; LOW TEMPERATURE; PHOTOLUMINESCENCE; PRIORITY JOURNAL; RAMAN SPECTROMETRY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 80955165954     PISSN: 13880764     EISSN: 1572896X     Source Type: Journal    
DOI: 10.1007/s11051-011-0460-6     Document Type: Article

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