|
Volumn 520, Issue 2, 2011, Pages 813-817
|
Fabrication and performance of TiN/TiAlN nanometer modulated coatings
|
Author keywords
Nano modulated structure; Performances; Texture and composition; TiN TiAlN
|
Indexed keywords
ANTI-CORROSION;
AR+ SPUTTERING;
BILAYER PERIOD;
CRITICAL LOAD;
ELECTROCHEMICAL CORROSION TESTS;
MODULATED STRUCTURES;
MULTILAYERED COATINGS;
NANO-MODULATED STRUCTURE;
PERFORMANCES;
PREFERRED ORIENTATIONS;
PULSED VACUUM;
SCANNING ELECTRON MICROSCOPES;
SCRATCH TEST;
SI(1 0 0);
WAFER SUBSTRATES;
X-RAY ENERGIES;
X-RAY PHOTOELECTRON SPECTROSCOPE;
CRYSTAL ATOMIC STRUCTURE;
ELECTROCHEMICAL CORROSION;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING SILICON COMPOUNDS;
SILICON ALLOYS;
SILICON WAFERS;
TITANIUM NITRIDE;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
COATINGS;
|
EID: 80755190070
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2011.04.159 Document Type: Conference Paper |
Times cited : (32)
|
References (26)
|